68 FR 83 pgs. 23105-23106 - Baylor College of Medicine,et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes
Type: NOTICEVolume: 68Number: 83Pages: 23105 - 23106
FR document: [FR Doc. 03-10672 Filed 4-29-03; 8:45 am]
Agency: Commerce Department
Sub Agency: International Trade Administration
Official PDF Version: PDF Version
DEPARTMENT OF COMMERCE
International Trade Administration
Baylor College of Medicine, et al. ; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes
This is a decision consolidated pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Suite 4100W, Franklin Court Building, U.S. Department of Commerce, 1099 14th Street, NW., Washington, DC.
Docket Number: 03-009. Applicant: Baylor College of Medicine, Houston, TX 77030. Instrument: Electron Microscope, Model JEM-1230. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 68 FR 14197, March 24, 2003. Order Date: September 12, 2002.
Docket Number: 03-011. Applicant: Rice University, Houston, TX 77251-1892. Instrument: Electron Microscope, Model JEM-2010. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 68 FR 14197, March 24, 2003. Order Date: August 30, 2002.
Docket Number: 03-012. Applicant: Beckman Research Institute of the City of Hope National Medical Center, Duarte, CA 91010. Instrument: Electron Microscope, Model Tecnai G2 12 TWIN. Manufacturer: FEI Company, The Netherlands. Intended Use: See notice at 68 FR 14197, March 24, 2003. Order Date: December 20, 2002.
Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 03-10672 Filed 4-29-03; 8:45 am]
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