79 FR 205 pgs. 63382-63383 - The Research Corporation of the University of Hawaii, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope
Type: NOTICEVolume: 79Number: 205Pages: 63382 - 63383
Pages: 63382, 63383FR document: [FR Doc. 2014-25256 Filed 10-22-14; 8:45 am]
Agency: Commerce Department
Sub Agency: International Trade Administration
Official PDF Version: PDF Version
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DEPARTMENT OF COMMERCE
International Trade Administration
The Research Corporation of the University of Hawaii, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope
This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution Avenue NW., Washington, DC.
Docket Number: 14-014. Applicant: The Research Corporation of the University of Hawaii, Honolulu, HI 96822. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 79 FR 54680, September 12, 2014.
Docket Number: 14-017. Applicant: Chehalis School District, Chehalis, WA 98532. Instrument: Electron Microscope. Manufacturer: Tescan, S.R.O., Czech Republic. Intended Use: See notice at 79 FR 48123, August 15, 2014.
Docket Number: 14-018. Applicant: University of Chicago, Chicago, IL 60637. Instrument: Electron Microscope. Manufacturer: Brno, Czech Republic. Intended Use: See notice at 79 FR 48123, August 15, 2014.
Docket Number: 14-020. Applicant: Louisiana State University, Shreveport, LA 71115. Instrument: Electron Microscope. Manufacturer: Delong Instruments A.s., Czech Republic. Intended Use: See notice at 79 FR 54680, September 12, 2014.
Docket Number: 14-022. Applicant: University of Nebraska-Lincoln, Lincoln, NE 68588-0645. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: See notice at 79 FR 54680-81, September 12, 2014.
Docket Number: 14-025. Applicant: Michigan State University, Grand Rapids, MI 49503. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 79 FR 54680-81, September 12, 2014.
[top] Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. Reasons: Each foreign instrument is an electron microscope and is intended for
Dated: October 16, 2014.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2014-25256 Filed 10-22-14; 8:45 am]
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