72 FR 233 pg. 68568 - Battelle Memorial Institute, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes
Type: NOTICEVolume: 72Number: 233Page: 68568
FR document: [FR Doc. E7-23576 Filed 12-4-07; 8:45 am]
Agency: Commerce Department
Sub Agency: International Trade Administration
Official PDF Version: PDF Version
DEPARTMENT OF COMMERCE
International Trade Administration
Battelle Memorial Institute, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes
This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. L. 106-36, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 2104, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC.
Docket Number: 07-062. Applicant: Battelle Memorial Institute, Richland, WA 99354. Instrument: Electron Microscope, Model FIB/SEM. Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 2007.
Docket Number: 07-063. Applicant: University of California, San Diego, La Jolla, CA 92093-0608. Instrument: Electron Microscope, Model Titan 80-300 C-Twin STEM. Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 2007.
Docket Number: 07-066. Applicant: St. Jude Children's Research Hospital, Memphis, TN 38105. Instrument: Electron Microscope, Model Tecnai G2 F20 TWIN. Manufacturer: FEI Company, Netherlands. Intended Use: See notice at 72 FR 63875, November 13, 2007.
Docket Number: 07-067. Applicant: National Institute for Occupational Safety and Health, Cincinnati, OH 45226. Instrument: Electron Microscope, Model JEM-2100F. Manufacturer: Jeol Ltd., Japan. Intended Use: See notice at 72 FR 63875, November 13, 2007.
Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as these instruments are intended to be used, was being manufactured in the United States at the time the instruments were ordered. Reasons: Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E7-23576 Filed 12-4-07; 8:45 am]
BILLING CODE 3510-DS-P